
Key features
- Dual side probing: full accessibility & parallel test
- Large boards testing: 1000 x 610mm (39.4 x 24’’)
- 20 kg max board weight
- Full test coverage
- Conveyor / Automatic / Manual board loading
- Micro-SMD & flexible circuit probing
Features
Multi-Mode Dual Side Probing
Multi-Mode Dual Side Probing
4060 S2 combines the advantages of dual-side flying probing, with the possibility to use additional tools such as fixed probes, planarity supports, mini bed-of-nails fixtures, and more.
- DUAL-SIDE FLYING PROBING
- BOTTOM MULTI-PROBE FLYING HEADS
- MULTI-MODE PROBING
Test also the biggest ones.
Test also the biggest ones.

- LARGE TEST AREA: The large test area allows 4060 S2 to fit boards with up to 1000 x 610mm (39.4 × 24’’) size
- BACKPLANES: 4060 S2 can test backplanes mounting any type of connector.
- TALL COMPONENTS: 4060 S2 tests also PCBs with transformers, heat sinks, connectors, front panels, polarized capacitors and other tall components up to 110mm.
Best Measurement Accuracy
Best Measurement Accuracy

- Highest measurement performance & accuracy (0.1pF)
- Signal integrity
- No measurement degradation or interference
- Immediate signal acquisition (within hundreds of microseconds)
Fast and accurate probing on the smallest components
Fast and accurate probing on the smallest components

- ULTRA HIGH-SPEED AXES. Full Linear Motion
- ACCURATE MICRO-PAD CONTACTING
- ULTRA-FAST SOFT TOUCH TECHNOLOGY
Full accessibility & parallel test
DUAL-SIDE FLYING PROBING: Four top-side and two bottom-side moving heads make 4060 S2 able to perform flying probe test on both sides of the board simultaneously, increasing throughput and test capabilities.
BOTTOM MULTI-PROBE FLYING HEADS: In addition to electrical probes for electrical tests, the two bottom multi-probe flying heads can move high-speed power probes, support rods, hi-res cameras, multi-probes, laser & LED probes and electro scan probes, covering the most comprehensive test needs.
MULTI-MODE PROBING: While using the 4 top-side probes to perform flying probe test, a bottom moving platform can be used for bed-of-nails fixtures, multiple high-current power supplies, digital I/O, high-speed signals. The dynamic planarity supports allow you to reliably test large and thin boards, avoiding PCB vibrations due to probe strokes.
Leonardo OS2
Easy. Fast. Self-programming.
- Automatic test program generation in minutes
- Automatic test program generation with or without CAD file
- – 50% test program generation time with new S2 System Control
- Faster & fully automatic Debug & Tuning
- Automatic board repair software
- Automatic Pick & Place X-Y file import
- Built-in Self-Test (BIST) compliant
- User-friendly intuitive graphical interface
- Control software to monitor, analyze & optimize the production process

Test Capabilities

In-Circuit Test

100% Short Circuit Test

Nodal Impedance Test

Open Pin Scan

Power On Test

Functional Test

Optical Test

Led Light Test

3D Laser Test

Flashing

Boundary Scan

Thermal Test

Waveform Capture

5G RF Test

Built-In-Self-Test
Technical Data
4060 S2 | |
---|---|
Application | Low to Medium Production Repair |
Throughput | Very high throughput |
Chassis | Structural steel |
UUT probing | Dual + Single Side combined |
Multi-Probe Flying Heads | 6 (4 top + 2 bottom) |
Max. Board Size (L x W) | Manual: 686 x 610mm (27 x 24’’) In-Line: 1000 x 610mm (39.4 x 24’’)* |
Footprint (L x W) | 1750 x 1272mm (2.2m2) |
* For larger boards, please contact SPEA. |